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v-if="item.Whir_U_Content_Category_PId==item1.CategoryId" href="javascript:void(0);" class="inp"> <input type="checkbox" v-model="CategoryValue" :value="item1.Whir_U_Content_PId+','+item.Whir_U_Content_Category_PId" @change="change_option"> <div class="txt"> <label for="" class="dots"></label> <span>{{item1.TheFilterCriteria}}</span> </div> </div> </dd> </dl> </div> </div> </div> <div class="right"> <div class="proflex"> <div v-cloak v-for="item in IsShow" :class="'boxlist boxlist' + (parseInt(item) + 1)"> <div class="column-head2"> <em class="dot">{{proinfo[item].CategoryName}}</em> <aside>{{proinfo[item].intro}}</aside> </div> <div class="owl-carousel owl-theme" :key="'c_'+proinfos.length"> <div class="item" v-cloak v-for="item1 in proinfos" v-if="proinfo[item].Whir_U_Content_Category_PId==item1.CategoryID"> <div class="pic"> <div class="hover"> <a :href="item1.link"> <h2>{{item1.Title}}</h2> <p>{{item1.homeintro}}</p> </a> </div> <a :href="item1.link" class="Ispic" :style="'background-image:url('+uploadurl+sup(item1.ImageMore)+');'"> <img :src="uploadurl+sup(item1.ImageMore)" :alt="item1.Title" class="use in ie8" /> </a> </div> <div class="txt"> <h3><a :href="item1.link" class="dot">{{item1.Title}}</a></h3> <a :href="item1.link" class="btn">learn more</a> </div> </div> </div> </div> </div> </div> </div> </div> <script> var app = new Vue({ el: "#app", data: { proinfo: {}, IsShow: [], proinfos: {}, searchinfo: {}, searchinfos: {}, uploadurl: "/uploadfiles/", lcid_arr:['128'], CategoryValue:[''], AppFunctionality: [], WaferSize: [], TheWorking: [], TheCustomerType: [], Control: [], href: "", lcid: '128' }, watch:{ lcid_arr:{ immediate:true, handler(newValue){ var self=this; self.GetInfo(); self.loadhtml(); } }, CategoryValue:{ immediate:true, handler(newValue){ var self=this; var Id = newValue.length > 0 && newValue[0].length > 0 ? newValue[newValue.length - 1].split(',')[1] * 1 : 0; var arr=[]; newValue.forEach(item=>{ arr.push(item.split(',')[0]); }); self.AppFunctionality = []; self.TheWorking = []; self.TheCustomerType = []; self.WaferSize = []; self.Control = []; arr.forEach(v => { if (v.length > 0) { for (let row of self.searchinfos.filter(item => item.Whir_U_Content_PId == parseInt(v))) { switch (parseInt(row.CategoryId)) { case 162: self.AppFunctionality.push(v); break; case 161: self.TheWorking.push(v); break; case 82: self.TheCustomerType.push(v); break; case 159: self.WaferSize.push(v); break; case 160: self.Control.push(v); break; } } } }); self.GetInfo(); self.loadhtml(); } } }, methods: { change_radio(event) { this.lcid = event.currentTarget.value; this.lcid_arr = this.lcid.split(','); }, change_option() { var checkboxes = document.querySelectorAll('input[name="chkcategory"]'); if (checkboxes.length > 0) { checkboxes[0].checked = true; this.lcid_arr = checkboxes[0].value.split(','); } }, GetInfo: function () { var self = this; $.ajax({ url: "/Ajax/GetProInfoEN.aspx", data: { lcid: self.lcid_arr.join(','), AppFunctionality: self.AppFunctionality.join(','), WaferSize: self.WaferSize.join(','), TheWorking: self.TheWorking.join(','), TheCustomerType: self.TheCustomerType.join(','), Control: self.Control.join(','), }, datatype: "json", type: "POST", async: false, success: function (data) { var jsondata = JSON.parse(data); if (jsondata.state == 1) { alert("Failed to get data!"); } else { self.proinfo = jsondata.data; self.proinfos = jsondata.datainfo; self.searchinfo = jsondata.search; self.searchinfos = jsondata.searchinfo; var showlist = []; for (var index1 in self.proinfo) { for (var index2 in self.proinfos) { if (self.proinfos[index2].CategoryID == self.proinfo[index1].Whir_U_Content_Category_PId) { showlist.push(index1); break; } } } self.IsShow = showlist; self.href = '/products/info_itemid_.html'; self.$nextTick(function () { self.loadhtml(); }); } } }) }, searchkey: function (Id, obj, name) {//AppFunctionality WaferSize 79 晶圆尺寸 TheWorking 81工作环境 TheCustomerType 82客户类型 Control 80 控制方式 var self = this; //$("#dd" + Id + " a").removeClass(); //if (obj.currentTarget.className== "on") { // obj.currentTarget.className = ""; //} else { // obj.currentTarget.className = "on"; //} self.sub(Id, name, obj); self.GetInfo(); self.loadhtml(); }, sub: function (Id, name, obj) { var self = this; var arr = []; if (obj.currentTarget.className == "on") obj.currentTarget.className = ""; else obj.currentTarget.className = "on"; $(".Spec002780 .auto dl dd a[name='li" + Id + "']").each(function () { if ($(this).hasClass("on")) { arr.push($(this).attr("data")); } }); switch (Id) { case 162: self.AppFunctionality = arr; break; case 161: self.TheWorking = arr; break; case 82: self.TheCustomerType = arr; break; case 159: self.WaferSize = arr; break; case 160: self.Control = arr; break; } }, GoPage:function(url){ window.location.href=url; }, loadhtml: function () { var self = this; for (var i = 1; i <= self.proinfo.length; i++) { var $slider = $(".boxlist" + i + " .owl-carousel") $slider.trigger('destroy.owl.carousel'); $slider.owlCarousel({ loop: false, margin: 20, nav: true, lazyLoad: true, responsive: { 0: { items: 1 }, 480: { items: 1 }, 640: { items: 1 }, 1000: { items: 1 } } }) } //self.SetChoosed(); }, SetChoosed: function () { var rxxl = "0";//热销和系列 var probrand = "0";//品牌 var uage = "0";//年龄 if (rxxl == "0") { $("#rxxl_0").addClass("on"); $("#rxxl_00").addClass("on"); } $("#rxxl_" + rxxl).addClass("on"); $("#probrand_" + probrand).addClass("on"); $("#uage_" + uage).addClass("on"); $(window).on("resize", function (e) { var w_Spec002780 = $(window).width() if (w_Spec002780 <= 1920) { $(".Spec002780 dl").each(function () { var h = $(this).find("dd").height() if (h > 36) { $(this).find("dd").height(36); $(this).find("dd").find("span").show(); } }); } else { $(".Spec002780 dd").attr("style", " "); $(".Spec002780 dd").find("span").hide(); $(".Spec002780 dd span").text("Learn More"); } //end }).trigger("resize"); // $(".Spec002780 dd span").click(function (e) { if ($(this).find("b").text() == 'Learn More') { $(this).find("b").text("Put away"); $(this).find("i").addClass("on"); $(this).parent("dd").height("auto"); } else { $(this).find("b").text("Learn More"); $(this).find("i").removeClass("on"); $(this).parent("dd").height(36); } }); }, htmlHref: function (href, parm) { return href.replace(".html", parm); }, sup: function (value) { if (value == '' || value == undefined) return '' value = value.split('*')[0]; return value; } }, mounted: function () { var self = this; self.GetInfo(); //InEL(); //echartss() //调用echarts } }) </script> <script> //SetChoosed(); //设置选中 function SetChoosed() { var rxxl = "0";//热销和系列 var probrand = "0";//品牌 var uage = "0";//年龄 if (rxxl == "0") { $("#rxxl_0").addClass("on"); $("#rxxl_00").addClass("on"); } $("#rxxl_" + rxxl).addClass("on"); $("#probrand_" + probrand).addClass("on"); $("#uage_" + uage).addClass("on"); } //筛选项 function GetProChoose(arg, arg_val) { //如果品牌清零，则年龄需要清零 if (arg == "probrand" && arg_val == 0) { var url = location.href; var url1 = changeURLArg(url, "probrand", "0");//清除品牌 location.href = changeURLArg(url1, "uage", "0");//清除年龄 return; } //如果品牌的值修改了，则年龄需要清零 var oldprobrand = "0"; if (arg == "probrand" && arg_val != oldprobrand) { var url = location.href; var url1 = changeURLArg(url, "probrand", arg_val);//清除品牌 location.href = changeURLArg(url1, "uage", "0");//清除年龄 return; } //如果参数是年龄，则判断品牌id是否正确 if (arg == "uage") { var parentid = $("#uage_" + arg_val).attr("parentid");//获取年龄所属品牌 var url = location.href; var url1 = changeURLArg(url, "probrand", parentid);//设置品牌值 location.href = changeURLArg(url1, "uage", arg_val);//设置年龄值 return; } //常规值替换 var url = location.href; location.href = changeURLArg(url, arg, arg_val); } /* * url 目标url * arg 需要替换的参数名称 * arg_val 替换后的参数的值 * return url 参数替换后的url */ function changeURLArg(url, arg, arg_val) { var pattern = arg + '=([^&]*)'; var replaceText = arg + '=' + arg_val; if (url.match(pattern)) { var tmp = '/(' + arg + '=)([^&]*)/gi'; tmp = url.replace(eval(tmp), replaceText); return tmp; } else { if (url.match('[\?]')) { return url + '&' + replaceText; } else { return url + '?' + replaceText; } } return url + '\n' + arg + '\n' + arg_val; } $(function ($) { //$(window).on("resize", function (e) { // var w_Spec002780 = $(window).width() // if (w_Spec002780 <= 1920) { // $(".Spec002780 dl").each(function () { // var h = $(this).find("dd").height() // if (h > 36) { // $(this).find("dd").height(36); // $(this).find("dd").find("span").show(); // } // }); // } else { // $(".Spec002780 dd").attr("style", " "); // $(".Spec002780 dd").find("span").hide(); // $(".Spec002780 dd span").text("更多"); // } // end //}).trigger("resize"); //$(".Spec002780 dd span").click(function (e) { // if ($(this).find("b").text() == '更多') { // $(this).find("b").text("收起"); // $(this).find("i").addClass("on"); // $(this).parent("dd").height("auto"); // } else { // $(this).find("b").text("更多"); // $(this).find("i").removeClass("on"); // $(this).parent("dd").height(36); // } //}); //end }); </script> <div class="clear"></div> </div> </div> <div style="display:none"><h1> Automatic Wafer Probers | RF/DC Probe Station | Microprobe Semiconductor Equipment | Probe Test System | SEMISHARE</h1><p> Explore our automatic wafer probers, DC probe stations, microprobe stations, RF probe stations and more. SEMISHARE offers microprobe probe test systems and wafer probing solutions for semiconductor research, development and manufacturing.</p><h3> SEMISHARE: Leading the Future of Semiconductor Testing</h3><p> In the ever-evolving world of semiconductor manufacturing, the demand for precision, reliability, and efficiency in testing processes has never been greater. As semiconductor devices continue to shrink in size while increasing in complexity, testing solutions must keep pace with these advancements. A well-engineered probe station system is essential to achieving these goals, providing a stable and high-precision platform for testing semiconductor wafers. SEMISHARE, a pioneer in semiconductor testing solutions, is at the forefront of this technological revolution with its state-of-the-art probe station system and wafer probing systems. By integrating cutting-edge automation and precision engineering, SEMISHARE ensures that each probe station system meets the highest standards of accuracy and efficiency. This article delves into the intricate world of semiconductor testing, exploring the various technologies and solutions offered by SEMISHARE that are shaping the future of the industry.</p><h3> The Essence of Wafer Probing</h3><p> At the heart of semiconductor testing lies the wafer prober, a sophisticated piece of equipment crucial for ensuring the quality and performance of semiconductor devices. A well-designed wafer probe station is vital in detecting defects early in the manufacturing process, reducing costs, and improving overall production yield. But what exactly does a wafer prober do? A wafer prober, also known as a probe station or prober station, is designed to perform detailed electrical tests on semiconductor wafers before they are cut into individual chips. This essential function of the wafer probe station allows manufacturers to identify faulty dies before they reach the packaging stage, thus preventing unnecessary material waste and ensuring only high-quality chips proceed further in the production pipeline.</p><h4> SEMISHARE's Automatic Wafer Prober</h4><p> SEMISHARE's automatic wafer prober takes this technology to the next level, offering unparalleled speed and precision in testing. With capabilities extending across various wafer sizes (2", 4", 6", 8", and 12"), SEMISHARE's wafer probers cater to a wide range of testing needs in the semiconductor industry. The automatic wafer prober from SEMISHARE incorporates advanced features such as auto-alignment, auto-focus, and multi-site testing, significantly enhancing throughput and accuracy.</p><p> The company's wafer prober lineup includes both manual and automatic systems, ensuring that whether you need a basic wafer prober for research or a high-throughput automatic wafer prober for production, SEMISHARE has the right solution. Each wafer prober is designed with precision and reliability in mind, incorporating SEMISHARE's proprietary technologies to enhance performance and ease of use. By continuously refining its probe station system, SEMISHARE ensures that semiconductor manufacturers, research institutions, and testing facilities receive the most advanced solutions available in the market today.</p><h3> The Multifaceted World of Probe Stations</h3><p> probe stations come in various forms, each tailored to specific testing requirements. An advanced probe station system ensures precise contact with semiconductor wafers, minimizing measurement errors and improving efficiency. SEMISHARE offers a comprehensive range of probe stations, including:</p><h4> 1. DC Probe Station</h4><p> The dc probe station is fundamental for basic electrical characterization of semiconductor devices. Integrated into a wafer probe station, it allows precise voltage and current measurements, ensuring device reliability. SEMISHARE's dc probe station offers high-precision measurements for parameters such as voltage, current, and resistance. The dc probe station is equipped with advanced shielding to minimize electromagnetic interference, ensuring accurate low-noise measurements. SEMISHARE's dc probe station lineup includes models suitable for both research and production environments, with options for manual, semi-automatic, and fully automatic operation.</p><h4> 2. Micro Probe Station and Microprobe Station</h4><p> For testing at the microscopic level, SEMISHARE's micro probe station and microprobe station provide the necessary precision and stability. These systems are essential components of a probe station system, allowing sub-micron level probing for MEMS and small-scale semiconductor devices. These stations are crucial for testing small-scale devices and MEMS (Micro-Electro-Mechanical Systems). The micro probe station and microprobe station feature high-magnification optics and ultra-fine positioning systems, allowing for precise probing of devices with pad sizes down to a few microns. SEMISHARE's micro probe station and microprobe station are ideal for applications such as failure analysis, device characterization, and MEMS testing.</p><h4> 3. Microwave Probe Station</h4><p> In the realm of high-frequency testing, the microwave probe station plays a vital role. A high-performance wafer probe station is essential for maintaining signal integrity in microwave frequency measurements. SEMISHARE's microwave probe station is designed to handle the challenges of testing devices operating at microwave frequencies. The microwave probe station incorporates specialized RF-optimized components to maintain signal integrity up to 110 GHz and beyond. SEMISHARE's microwave probe station lineup includes models with integrated vector network analyzers for streamlined S-parameter measurements.</p><h4> 4. RF Probe Station</h4><p> For radio frequency testing, the rf probe station is indispensable. To achieve precise RF measurements, a reliable probe station system must include proper calibration tools and RF probe integration. SEMISHARE's rf probe station offers precise measurements for devices used in wireless communications and other RF applications. The rf probe station features calibration substrates and specialized RF probes to ensure accurate high-frequency measurements. SEMISHARE's rf probe station can be configured for on-wafer noise figure measurements, load-pull testing, and other advanced RF characterization techniques.</p><h4> 5. Semiconductor Probe Station</h4><p> As a comprehensive solution, SEMISHARE's semiconductor probe station integrates various testing capabilities, making it a versatile tool for semiconductor manufacturers and researchers alike. A robust wafer probe station in this category ensures seamless testing across multiple device types, optimizing performance evaluation. The semiconductor probe station can be customized with different chuck options, probe card interfaces, and measurement instrumentation to suit specific testing requirements. SEMISHARE's semiconductor probe station is designed for ease of use, with intuitive software interfaces and ergonomic hardware design.</p><h3> The Purpose and Functionality of Probe Stations</h3><p> Understanding the purpose of a probe station is crucial for appreciating its role in semiconductor manufacturing. A probe station serves as a stable and accurate platform for testing semiconductor wafers, allowing for the early detection of defects and performance issues. In modern semiconductor fabrication, an advanced probe station system is essential for ensuring product reliability and optimizing yield rates. SEMISHARE's probe stations are engineered to provide the highest level of stability and measurement accuracy, ensuring reliable test results across a wide range of device types and test conditions.</p><h4> How does a probe station work?</h4><p> The process typically involves:</p><p> 1. Wafer loading onto the chuck</p><p> 2. Alignment of probes with test pads on the wafer</p><p> 3. Lowering of probes to make contact with the wafer</p><p> 4. Execution of electrical tests</p><p> 5. Data collection and analysis</p><p> A well-designed wafer probe station enhances each step of this workflow, minimizing errors and maximizing efficiency. SEMISHARE's probe stations are designed to optimize each step of this process, ensuring maximum efficiency and accuracy. The company's advanced probe station software provides seamless integration with test equipment and data analysis tools, streamlining the entire testing workflow.</p><h3> The Role of Probes in Semiconductor Testing</h3><p> A <strong>probe</strong> in semiconductor testing is more than just a simple contact point. It's a sophisticated tool designed to transmit electrical signals to and from the device under test with minimal interference. In a high-performance probe station system, precise probe alignment and stable electrical connections are critical for achieving accurate measurements. SEMISHARE's probe station probes are engineered for optimal performance, ensuring reliable contact and accurate measurements. The company offers a wide range of probe station probes, including DC probes, RF probes, and high-power probes, each optimized for specific testing requirements.</p><h4> Probe System</h4><p> The probe system in SEMISHARE's stations is a marvel of engineering, integrating seamlessly with the overall probe test system to provide comprehensive testing capabilities. Within a wafer probe station, these probe systems enable detailed parametric and functional testing of semiconductor devices at various production stages. From basic parametric tests to complex RF measurements, SEMISHARE's probe systems are equipped to handle a wide range of testing scenarios. The probe test system includes advanced features such as auto-calibration, real-time data analysis, and <strong>customizable test sequences</strong>, enhancing both efficiency and accuracy in semiconductor testing.</p><h3> Specialized Probe Stations</h3><h4> Cryogenic Probe Station</h4><p> For testing semiconductor devices at extremely low temperatures, SEMISHARE offers cryogenic probe stations. These specialized stations are crucial for research in superconductivity and quantum computing applications. A well-designed cryogenic probe station must integrate seamlessly within a larger probe station system to ensure precise temperature control and stable electrical connections. SEMISHARE's cryogenic probe station incorporates advanced thermal management systems to maintain stable low temperatures while allowing precise probing of devices.</p><h4> Microwave Probes and Their Applications</h4><p> microwave probes are essential tools for high-frequency testing. SEMISHARE's microwave probes are designed to maintain signal integrity at frequencies up to 110 GHz and beyond. When integrated into a high-performance wafer probe station, microwave probes enable precise RF and mmWave measurements, critical for next-generation semiconductor technologies. Using a microwave probe requires expertise, and SEMISHARE provides comprehensive training and support to ensure optimal usage of these sophisticated tools. The company's microwave probe station is equipped with specialized calibration substrates and software to facilitate accurate high-frequency measurements.</p><h3> Probe Equipment: The Backbone of Semiconductor Testing</h3><p> SEMISHARE's probe equipment forms the backbone of modern semiconductor testing. Our comprehensive range of probe equipment caters to diverse testing needs, from basic research to high-volume production. The probe equipment offered by SEMISHARE includes not only probe stations but also a wide array of accessories and specialized tools, ensuring a complete probe station system that enhances testing efficiency and accuracy.</p><p> Key features of SEMISHARE's probe equipment include:</p><h4> 1. Modular design for easy upgrades and customization</h4><p> The modular structure allows seamless integration with advanced wafer probe station setups, ensuring flexibility for future technology advancements.</p><h4> 2. High-precision positioning systems for accurate measurements</h4><p> These positioning systems are optimized for sub-micron accuracy, making them ideal for probe station system configurations requiring delicate probe contact.</p><h4> 3. Advanced thermal management for temperature-controlled testing</h4><p> Effective thermal regulation is crucial for semiconductor testing, especially in wafer probe station environments where maintaining stability is essential for reliable data collection.</p><h4> 4. Electromagnetic shielding for noise-free measurements</h4><p> To achieve high-fidelity signal capture, SEMISHARE’s probe equipment is engineered with advanced shielding techniques, minimizing external interference and ensuring that the probe station system operates under optimal conditions.</p><p> SEMISHARE's probe equipment is designed to work seamlessly together, creating a cohesive testing ecosystem. Whether you need probe equipment for DC testing, RF characterization, or specialized applications, SEMISHARE has the right solution. By incorporating a well-integrated probe station system, users can achieve high throughput and enhanced measurement accuracy across various testing scenarios.</p><p> The company's commitment to innovation is evident in its continuously evolving probe equipment lineup. SEMISHARE invests heavily in research and development to ensure its probe equipment remains at the cutting edge of technology, enabling wafer probe station users to stay ahead in an increasingly competitive semiconductor industry.</p><h3> Probe Station Probes: Precision at the Microscopic Level</h3><p> At the heart of any effective probe station are its <strong>probes</strong>. SEMISHARE's probe station probes are engineered for optimal performance across a wide range of testing scenarios. Our probe station probes are available in various configurations to meet different testing requirements, seamlessly integrating with probe station system setups to maximize efficiency.</p><p> Types of probe station probes offered by SEMISHARE include:</p><h4> 1. DC probe station probes for basic electrical measurements</h4><p> These probes are essential components of a wafer probe station, enabling precise low-frequency electrical testing with minimal resistance and noise interference.</p><h4> 2. RF probe station probes for high-frequency testing</h4><p> Designed for applications where signal integrity is critical, these probes work seamlessly within a probe station system to ensure reliable high-frequency measurements.</p><h4> 3. High-power probe station probes for power device characterization</h4><p> Power semiconductors require specialized probes that can handle high current and voltage conditions, making them indispensable in wafer probe station setups for advanced power electronics testing.</p><h4> 4. Fine-pitch probe station probes for testing densely packed devices</h4><p> With the miniaturization of semiconductor devices, fine-pitch probes are essential for accessing small test pads, ensuring accurate results within compact probe station system environments.</p><p> SEMISHARE's probe station probes are manufactured using advanced materials and techniques to ensure durability and consistent performance. The company offers both standard and custom probe station probes to meet specific customer needs, enabling a tailored approach for wafer probe station applications.</p><p> Regular maintenance and calibration of probe station probes are crucial for accurate measurements. SEMISHARE provides comprehensive support services for its probe station probes, including cleaning kits, replacement tips, and calibration services. Proper maintenance ensures that the entire probe station system continues to operate at peak performance, delivering precise and repeatable results.</p><h3> Prober Station: Combining Precision and Efficiency</h3><p> SEMISHARE's prober station solutions represent the pinnacle of semiconductor testing technology. A prober station from SEMISHARE combines high-precision probing capabilities with efficient wafer handling and test automation, forming an integral part of a wafer probe station that enhances productivity and accuracy.</p><p> Key features of SEMISHARE's prober station lineup include:</p><h4> 1. Advanced chuck design for stable wafer holding</h4><p> The chuck system ensures precise wafer stabilization, an essential component of any probe station system aimed at delivering high-accuracy testing results.</p><h4> 2. High-speed wafer alignment and mapping</h4><p> Integrated with wafer probe station technology, this feature minimizes alignment errors and enhances throughput, making it ideal for both research and mass production environments.</p><h4> 3. Integrated vision systems for accurate probe placement</h4><p> Advanced optical systems provide real-time feedback, improving probe alignment in probe station system applications where micron-level accuracy is required.</p><h4> 4. Compatibility with various probe card technologies</h4><p> SEMISHARE's prober stations are engineered to support a variety of probe cards, ensuring seamless integration into existing wafer probe station infrastructures.</p><p> Whether you need a manual prober station for research applications or a fully automated prober station for high-volume production, SEMISHARE has the right solution. Our prober station offerings are scalable and can be easily upgraded as your testing needs evolve, ensuring long-term compatibility with probe station system advancements.</p><p> SEMISHARE's prober station technology is continuously evolving to meet the challenges of testing next-generation semiconductor devices. The company's wafer probe station roadmap includes advancements in areas such as:</p><h4> 1. Enhanced parallelism for increased throughput</h4><p> Multi-die probing capabilities allow probe station system users to test multiple devices simultaneously, significantly reducing testing time.</p><h4> 2. Improved thermal management for wide-temperature testing</h4><p> Advanced cooling and heating mechanisms ensure precise temperature control, making wafer probe station testing more reliable across extreme conditions.</p><h4> 3. Integration of artificial intelligence for smart testing algorithms</h4><p> AI-driven automation enhances testing efficiency, allowing probe station system users to optimize probing strategies and minimize human intervention.</p><h4> 4. Support for advanced packaging technologies</h4><p> As semiconductor packaging becomes more complex, SEMISHARE’s wafer probe station solutions are designed to accommodate the latest chip architectures, including 3D ICs and chiplet-based designs.</p><p> By choosing a SEMISHARE prober station, you're not just investing in current technology, but also in a future-proof solution that can adapt to evolving semiconductor testing requirements. With its industry-leading probe station system and wafer probe station technology, SEMISHARE ensures that customers can confidently meet the challenges of next-generation semiconductor testing.</p><h3> The Synergy of Probe Equipment, Probe Station Probes, and Prober Stations</h3><p> The true power of SEMISHARE's solutions lies in the synergy between its probe equipment, probe station probes, and prober stations. When these elements work together seamlessly, they create a testing environment that is greater than the sum of its parts.</p><p> For example, SEMISHARE's advanced probe equipment enhances the performance of its probe station probes by providing stable and precise positioning. Similarly, the company's prober stations are designed to maximize the capabilities of both the probe equipment and probe station probes, resulting in a highly efficient and accurate testing process. This integration is particularly evident in SEMISHARE’s probe station system, which combines cutting-edge hardware and software to deliver unmatched performance. The wafer probe station components are engineered to work in perfect harmony, ensuring that every test is conducted with the highest level of precision.</p><p> This integrated approach to semiconductor testing sets SEMISHARE apart from competitors. By providing comprehensive solutions that encompass probe equipment, probe station probes, and prober stations, SEMISHARE ensures that its customers have all the tools they need to meet their testing challenges. The probe station system is a testament to SEMISHARE’s commitment to innovation, offering a seamless testing experience that maximizes efficiency and accuracy.</p><h3> Advanced Testing Methodologies</h3><h4> Four-Probe Method</h4><p> The <strong>four-probe method</strong> is a standard technique for measuring the resistivity of semiconductor materials. SEMISHARE's probe stations are fully equipped to perform <strong>four-probe</strong> measurements with high accuracy. The company's probe test system includes dedicated software modules for <strong>four-probe</strong> measurements, simplifying data collection and analysis. The wafer probe station is designed to handle the precise positioning required for <strong>four-probe</strong> testing, ensuring consistent and reliable results across a wide range of materials and devices.</p><h4> Flying Probe Test</h4><p> For testing printed circuit boards, the flying probe test is an efficient and flexible method. While not its primary focus, SEMISHARE's technology can be adapted for <strong>flying probe</strong> applications in certain scenarios. The company's expertise in precise probe positioning and control translates well to <strong>flying probe test systems</strong>. The probe station system leverages SEMISHARE’s advanced motion control technology, enabling accurate and repeatable measurements even in complex testing environments.</p><h4> RF Current Probe</h4><p> In RF testing, current probes play a crucial role. SEMISHARE's <strong>rf probe stations</strong> are compatible with various <strong>RF current probes</strong>, allowing for comprehensive RF characterization of devices. The company's rf probe station includes specialized fixtures and calibration tools for <strong>RF current probe</strong> measurements. The wafer probe station is equipped with advanced shielding and signal integrity features, ensuring accurate RF measurements even in high-frequency applications.</p><h3> SEMISHARE's Product Line-Up</h3><h4> A Series Automatic Probe Station</h4><p> The flagship of SEMISHARE's lineup, the A Series automatic wafer prober, offers unparalleled speed and precision for high-volume testing environments. This advanced <strong>wafer station</strong> incorporates state-of-the-art automation technologies to maximize throughput without compromising measurement accuracy.</p><h4> X Series Semi-Automatic</h4><p> Boasting the fastest test speed in the industry at over 70mm/s, the X Series semi-automatic probe station bridges the gap between manual and fully automatic systems. This versatile <strong>wafer station</strong> is ideal for medium-volume production and research applications requiring high-speed testing capabilities.</p><h4> CGX Series/High And Low Vacuum</h4><p> Designed for testing in controlled environments, the <strong>CGX Series</strong> offers capabilities for both high and low vacuum testing. This specialized <strong>wafer station</strong> is crucial for applications requiring precise environmental control, such as testing of sensitive MEMS devices.</p><h4> C Series/High/Low Temperature</h4><p> Capable of testing at temperatures ranging from -100°C to +300°C, the <strong>C Series</strong> is ideal for characterizing device performance across a wide temperature range. This thermal wafer station incorporates advanced temperature control systems to ensure stable and accurate measurements under varying thermal conditions.</p><h4> FA Series/Failure Analysis</h4><p> Specialized for failure analysis, this series provides the tools necessary for identifying and analyzing defects in semiconductor devices. The <strong>FA Series wafer station</strong> integrates advanced imaging capabilities with precise probing to facilitate comprehensive failure analysis.</p><h4> H Series/High Configuration</h4><p> Featuring SEMISHARE's proprietary Chuck Air bearing move™ technology, the <strong>H Series</strong> offers superior stability and precision in probe positioning. This high-end <strong>wafer station</strong> is designed for the most demanding testing applications, providing unmatched measurement accuracy and reliability.</p><h4> E Series/Cost-Effective</h4><p> Available in E4, E6, and E8 models, the E Series provides cost-effective solutions without compromising on quality. These wafer stations are ideal for educational institutions and small-scale production facilities looking for reliable testing capabilities at an accessible price point.</p><h4> M Series/Basic Model</h4><p> Ideal for educational institutions and small-scale testing, the <strong>M Series</strong> handles 4" to 6" wafers with ease. This entry-level <strong>wafer station</strong> offers a perfect balance of functionality and affordability, making it an excellent choice for teaching laboratories and startups.</p><h4> TEG Panel Probe Station</h4><p> Designed for testing Test Element Group (TEG) panels, this specialized station caters to the unique requirements of panel-level testing. The <strong>TEG Panel Probe Station</strong> incorporates large-area probing capabilities and customized chuck designs to accommodate various panel sizes and layouts.</p><h3> Innovations in Wafer Station Technology</h3><p> SEMISHARE's <strong>wafer station</strong> technology incorporates several innovative features:</p><h4> 1. Advanced chuck design for improved thermal uniformity</h4><h4> 2. High-precision stage control for accurate probe positioning</h4><h4> 3. Integrated vision systems for automated alignment</h4><h4> 4. Modular design for easy upgrades and maintenance</h4><p> These innovations ensure that SEMISHARE's wafer stations remain at the cutting edge of semiconductor testing technology. The company's continuous investment in research and development keeps its <strong>wafer station</strong> offerings at the forefront of the industry, meeting the evolving needs of semiconductor manufacturers and researchers.</p><h3> The Importance of Probe Test Systems</h3><p> A comprehensive probe test system is essential for thorough semiconductor characterization. SEMISHARE's <strong>probe test systems</strong> integrate seamlessly with their probe stations, offering:</p><h4> Automated test sequencing</h4><p> Streamlines the testing process, increasing throughput and consistency in results.</p><h4> Real-time data analysis</h4><p> Provides immediate feedback on device performance, enabling quick decision-making and process adjustments.</p><h4> Customizable test parameters</h4><p> Allows users to tailor testing conditions to specific device requirements, enhancing the relevance and accuracy of test results.</p><h4> Integration with factory automation systems</h4><p> Facilitates seamless incorporation into existing manufacturing workflows, improving overall production efficiency.</p><p> This integration allows for more efficient testing processes and faster time-to-market for semiconductor products. SEMISHARE's probe test system is designed with flexibility in mind, allowing users to easily configure and adapt the system for different testing requirements and device types.</p><h3> SEMISHARE's Commitment to Innovation</h3><p> SEMISHARE's dedication to advancing semiconductor testing technology is evident in its continuous research and development efforts. The company's innovations extend beyond hardware to include sophisticated software solutions for test automation and data analysis. By staying at the forefront of technological advancements, SEMISHARE ensures that its probe stations and wafer probers remain competitive in the rapidly evolving semiconductor industry.</p><h3> Customer Support and Customization</h3><p> Recognizing that every customer has unique testing requirements, SEMISHARE offers extensive customization options for its probe stations and testing systems. The company's experienced engineers work closely with clients to develop tailored solutions that meet specific testing needs. Whether it's a customized <strong>wafer station</strong> for unique device geometries or a specialized probe system for novel semiconductor materials, SEMISHARE is committed to providing bespoke solutions.</p><p> SEMISHARE also provides comprehensive customer support, including:</p><h4> On-site installation and training</h4><p> Ensures proper setup and operation of equipment, empowering users to maximize system capabilities.</p><h4> Regular maintenance and calibration services</h4><p> Maintains equipment performance and accuracy over time, extending the lifespan of the probe station system.</p><h4> Technical support hotline</h4><p> Offers prompt assistance for troubleshooting and operational inquiries, minimizing downtime.</p><h4> Software updates and upgrades</h4><p> Keeps the system current with the latest features and improvements, enhancing functionality and user experience.</p><p> This commitment to customer satisfaction ensures that SEMISHARE's clients can maximize the potential of their testing equipment, from basic probe stations to advanced <strong>automatic wafer probers</strong>.</p><h3> The Future of Semiconductor Testing</h3><p> As semiconductor devices continue to shrink in size and grow in complexity, the challenges of testing these devices will only increase. SEMISHARE is at the forefront of addressing these challenges, with ongoing research into:</p><h4> Advanced probing techniques for sub-10nm nodes</h4><p> Developing methods to test increasingly smaller and more complex semiconductor devices.</p><h4> Integration of artificial intelligence in test automation</h4><p> Enhancing testing efficiency and accuracy through intelligent automation.</p><h4> Novel probe materials for improved durability and signal integrity</h4><p> Ensuring reliable performance in demanding testing environments.</p><h4> Enhanced environmental control for extreme testing conditions</h4><p> Facilitating testing under a broader range of conditions to simulate real-world operating environments.</p><p> These advancements will shape the future of probe stations, wafer probers, and overall semiconductor testing methodologies, ensuring that SEMISHARE remains a leader in the field.</p><p> In the rapidly evolving field of semiconductor manufacturing, the role of precise and reliable testing cannot be overstated. SEMISHARE's comprehensive range of probe stations, wafer probers, and testing systems offers semiconductor manufacturers and researchers the tools they need to ensure the quality and performance of their devices.</p><p> From the versatile dc probe station to the advanced automatic wafer prober, from the specialized microwave probe station to the comprehensive test systems, SEMISHARE provides a complete suite of solutions to meet the diverse needs of the semiconductor industry.</p></div> <!-- Bottom002494 Start --> <div class="Bottom002494"> <footer> <div class="auto auto_1400 wrap-container clearfix"> <div class="botnav"> <ul class="ul clearfix"> <li> <dl class="dl"> <dt> Products </dt> <dd><a href='/products/probe-station-system.html' class="dot">Probe Station System</a></dd> <dd><a href='/products/testsystem.html' class="dot">Test System</a></dd> <dd><a href='/products/laser-repair-system.html' class="dot">Laser Repair System</a></dd> <dd> <wtl:list sql=" select top 1 whir_u_content_category_pid from whir_u_content_category where typeid=340 and isdel=0 order by sort desc,createdate desc"> <a href='/testservice/list.html' class="dot"> Test Service </a></dd> <dd> <a href='/accessories/list.html' class="dot"> Accessories </a></dd> </dl> </li> <li> <dl class="dl"> <dt>Accessories</dt> <dd><a href='/accessories/list_lcid_146.html'>Temperature Chuck</a></dd> <dd><a href='/accessories/list_lcid_151.html'>Micropositioner</a></dd> <dd><a href='/accessories/list_lcid_150.html'>Probe Holder</a></dd> <dd><a href='/accessories/list_lcid_149.html'>Probe</a></dd> <dd><a href='/accessories/list_lcid_148.html'>RF Probe</a></dd> <dd><a href='/accessories/list_lcid_147.html'>Adapter</a></dd> <dd><a href='/accessories/list_lcid_198.html'>anti vibration table</a></dd> </dl> </li> <li> <dl class="dl"> <dt>Test Service</dt> <dd><a href='/testservice/list_lcid_199.html'>Test Service</a></dd> </dl> </li> <li> <dl class="dl"> <dt>Test Solution</dt> <dd><a href='/overview/'>Technology</a> </dd> <dd><a href='/application/'>Application</a> </dd> <dd><a href='/probestationsolutionhomepage/'>Probe Station Solution</a> </dd> <dd><a href='/fixthehomepage/'>Laser System Solutions</a> </dd> </dl> </li> <li> <dl class="dl"> <dt>Service &Support</dt> <dd><a href='/producttmcscustomization/'>Product Customization</a> </dd> <dd><a href='/qualityassurance/'>Quality Assurance</a> </dd> <dd><a href='/aftersalesservice/'>After-Sales Service</a> </dd> <dd><a href='/commonproblem/'>Product FAQ</a> </dd> <dd><a href='/download/'>Download</a> </dd> </dl> </li> <li> <dl class="dl"> <dt>Company</dt> <dd><a href='/companyprofile/'>About SEMISHARE</a> </dd> <dd><a href='/organizationalarchitecture/'>Sustainable Development Management</a> </dd> <dd><a href='/corporatenews/list.html'>News & Events</a> </dd> </dl> </li> </ul> </div> <div class="other clearfix"> <div class="rwmbox"> <p>Follow SEMISHARE</p> <div class="iconbox clearfix"> <a href="#codeimg" class="fancybox"> <div id="codeimg" style="display:none;"> <div class="pic"> <img src="/uploadfiles/2025/05/20250506141244216.png?MDZjN2Y4NTEtOWM3Yy00ZTI5LWE1ZmQtNmM2ZGJhNWI2YzJlLnBuZw==" alt="Company's WeChat" style="display: block;margin: 0 auto;"> <p style="margin: 0;text-align: center;"> Company's WeChat</p> </div> </div> </a> <script> $(document).ready(function () { $('.fancybox').fancybox(); 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